Yonata’s Silicon Photonics (SiPh) test systems streamline the characterization and screening of photonic integrated circuits (PICs) and integrated optical-electrical devices, from wafer-level testing to die-level testing of bare dies and chip-on-carrier (CoC) assemblies.
Built around the SWT5100, these solutions integrate high-precision source measure units (SMUs) with femtoampere- and nanovolt-level measurement capabilities, together with high-speed optical and electrical test instruments, including DCAs and BERTs. They provide a reliable test environment from prototyping through high-volume production.