By combining high-speed optical/electrical signal processing technologies with chip-level handling capabilities, we provide mass-production test solutions for optoelectronic devices.

We develop customized test systems for PIC, OE, and CPO wafer and die testing, tailored to diverse device geometries and test requirements.We design and manufacture our own BERT boards, enabling full RF test capability.Through multi-site testing, we maximize test efficiency and deliver optimal solutions for high-volume production.