SiPh Wafer Test System CPO Test System WAT & RDL Test Systems HBM KGSD Test System Advanced Test

WAT & RDL Test Systems PXIe SMU【M3011S / M0204 / M2041】

  • Adaptive Precision-fast Control Fast and high-precision output with various load, enabled by user-setting APFC parameter
  • High DC Measurement Performance High voltage and current range with four-quadrant source & measure capability
    Very fine measurement resolution reaching to 0.1 fA and 100 nV
    Auto ranging
  • High-speed Testing Maximal 1 MS/s ADC sampling rate
    Programmable NPLC setting
  • Rich Measurement Mode Support both local and remote sense
    Various sweep modes (linear, log, list, etc.), up to 8 K points
    Measurement with user-defined source delay
    Synchronous measure by 8x internal trig bus and 2x external DIOs
  • Intuitive User Interface and Remote Control Remote control by GUI tool on PC
    Support standard SCPI programming
  • Built-in Over-temperature, Overvoltage and Overcurrent Protection