Co-Packaged Optics KGD Test System
【OST-3100】
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Modular Handling & Carrier Compatibility
Modular load/unload design supporting standard and customized carrier formats, including Gel-Pak and trays
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High-Throughput Parallel Testing
Supports up to four-site parallel testing
UPH up to 400 at TT = 0 s
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High-Speed Electrical Testing
Supports at-speed electrical testing for CPO devices
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High-Precision Pick & Place
Pick-and-place accuracy: ≤ ±10 μm
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Reliable Contact Design
Air-damper socket-based design
Dual-force contact up to 20 kgf, customizable for different applications
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Wide Temperature Testing
Test temperature range from 25 °C to 85 °C
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Integrated AOI Inspection
Supports 6S AOI with 30 μm resolution
Integrated QR code and OCR systems for device identification and traceability
