SiPh Wafer Test System CPO Test System WAT & RDL Test Systems HBM KGSD Test System Advanced Test

WAT & RDL Test Systems Benchtop SMU【B1202-B2031】

  • Multi-channel Testing Populated with multiple channels (up to 8 channels)
  • High DC Measurement Performance Broad ranges for voltage and current measurement (four-quadrant source & meter)
    Fine measurement resolution reaching sub-pA and sub-μV levels
    Auto-ranging
  • High-speed Testing Maximal 1 MS/s ADC sampling rate
    Programmable NPLC setting
  • Rich Measurement Mode Support both local and remote sense
    Various sweep modes (linear, log, list, etc.), up to 64 K points
    Measurement with user-defined source delay
  • Intuitive User Interface and Remote Control LCD touch panel for easy operation and data result
    Remote control by GUI tool on PC
    Support standard SCPI programming
  • Built-in Over-temperature, Overvoltage and Overcurrent Protection