SiPh Wafer Test System CPO Test System WAT & RDL Test Systems HBM KGSD Test System Advanced Test

WAT & RDL Test Systems High-WPH Multisite RDL WAT System【PPT8200】

  • High-Throughput Parallel Testing Supports 2- to 4-site parallel testing with per-pin SMU architecture
    Boosts WPH and yield while reducing test cost and cleanroom footprint
  • Scalable & Flexible Design Supports external instruments for diverse test applications
    Powerful Testing Capability. Up to 48 pins with full Kelvin connections
  • Ultra-High Precision 1 pA measurement accuracy
    System leakage below 100 fA
  • Comprehensive Compatibility Compatible with mainstream 48-pin probe cards and probers like TEL and TSK series
  • Integrated Smart Software CAL, DIAG, and PV software enable customizable logs, fast diagnostics, and remote monitoring